Study on spectral calibration of an ultraviolet Fourier transform imaging spectrometer with high precision

Wenming Yang; Ningfang Liao; Haobo Cheng; Yasheng Li; Xueqiong Bai; Chengyang Deng

doi:10.1117/12.2295320

12 January 2018 Study on spectral calibration of an ultraviolet Fourier transform imaging spectrometer with high precision

Wenming Yang, Ningfang Liao, Haobo Cheng, Yasheng Li, Xueqiong Bai, Chengyang Deng

Author Affiliations +

Proceedings Volume 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology; 106201L (2018) https://doi.org/10.1117/12.2295320
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

In this paper, we reported the laboratory spectral calibration of an ultraviolet (UV) Fourier transform imaging spectrometer (FTIS). A short overview of the designed UV-FTIS, which feature with a Cassegrain objective, an Offner relay optics system and a spatial-and-temporal modulation Michelson structure, is given. The experimental setup of spectral calibration is described, including details of the light source and integrating sphere. A high pressure mercury lamp was used to acquire reference spectrum. We calculated the all optical path difference (OPD) to achieve spectral response of every wavelength sample and divided the position of reference peak to subpixel to increase the precision of spectral calibration. The spectrum of spectral calibration show two weakly responded peaks, which was validated by reference spectrum of fiber optic spectrometer. The deviation of wavelength calibration is low to establish a best spectrometer resolution. The results of spectral calibration can meet the requirements of the UV-FTIS application.

Citation Download Citation

Wenming Yang, Ningfang Liao, Haobo Cheng, Yasheng Li, Xueqiong Bai, and Chengyang Deng "Study on spectral calibration of an ultraviolet Fourier transform imaging spectrometer with high precision", Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 106201L (12 January 2018); https://doi.org/10.1117/12.2295320

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