Dual-band MWIR/LWIR focal plane arrays based on III-V strained-layer superlattices

Alexander R. Gurga; Brett Z. Nosho; Sevag Terterian; Shuoqin Wang; Rajesh D. Rajavel

doi:10.1117/12.2309720

23 May 2018 Dual-band MWIR/LWIR focal plane arrays based on III-V strained-layer superlattices

Alexander R. Gurga, Brett Z. Nosho, Sevag Terterian, Shuoqin Wang, Rajesh D. Rajavel

Proceedings Volume 10624, Infrared Technology and Applications XLIV; 106240O (2018) https://doi.org/10.1117/12.2309720
Event: SPIE Defense + Security, 2018, Orlando, FL, United States

Abstract

Recent advances over the last several years in III-V strained-layer superlattice-based infrared detectors have lead this material system to emerge as a solid alternative to HgCdTe for dual-band focal plane arrays (FPAs). Rapid development of superlattice-based detectors has been realized by capitalizing on mature, III-V foundry-compatible processing. Furthermore, superlattice-based epitaxial wafers exhibit a high degree of lateral uniformity with low macroscopic defect densities (< 50 cm^-2) and can achieve dark current levels comparable to HgCdTe detectors. In this paper, we review our recent efforts towards producing HD-format (1280x720, 12 μm pitch) superlattice-based, dual-band MWIR/LWIR FPAs. For a representative FPA, characterization was conducted in a pour-fill dewar at 80K, f/3 and using a blackbody range of 22°C to 32°C. For the MWIR band, the noise equivalent temperature difference (NETD) was 14.9 mK with a 3x median NETD operability of 99.91%. For the LWIR band, the median NETD was 28.1 mK with a 3x median NETD operability of 99.66%. To illustrate the manufacturability of superlattice technology, we will present results on 1280x720, 12 μm pitch MWIR/LWIR FPAs built over the last year at HRL through multiple fabrication lots utilizing 4" epiwafers.

Citation Download Citation

Alexander R. Gurga, Brett Z. Nosho, Sevag Terterian, Shuoqin Wang, and Rajesh D. Rajavel "Dual-band MWIR/LWIR focal plane arrays based on III-V strained-layer superlattices", Proc. SPIE 10624, Infrared Technology and Applications XLIV, 106240O (23 May 2018); https://doi.org/10.1117/12.2309720

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