MTF measurements, identifying bias, and estimating uncertainty

David P. Haefner

doi:10.1117/12.2303974

26 April 2018 MTF measurements, identifying bias, and estimating uncertainty

David P. Haefner

Proceedings Volume 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX; 1062506 (2018) https://doi.org/10.1117/12.2303974
Event: SPIE Defense + Security, 2018, Orlando, FL, United States

Abstract

The modulation transfer function (MTF) describes how an imaging system will modify the spatial frequency content of a scene. Many performance metrics are strongly dependent on the MTF as it provides information of the limiting resolution. To measure the MTF, an image of a known or assumed scene is analyzed. In this correspondence we will detail potential issues that can contribute uncertainty or bias into the calculation of the MTF when using a tilted edge to super-resolve the system MTF of a sampled imaging system. Differences in measuring the system MTF can be categorized into 4 categories: data corruption, equipment, operator selection, and system under test effects. For each category we provide notional examples to demonstrate the severity of the measurement uncertainty as well as best practices to avoid or reduce their influence. We provide the full 2D derivation of the tilted edge technique, highlighting the impact of non-uniformity. We will discuss the influence of finite regions of interest (ROI) and stray-light, defective pixels, non-uniform illumination, and non-square pixels. Additionally we show how confidence intervals from sensor noise can be estimated and how they are related to frame averaging and ROI size. In support of the reproducible research effort, the Matlab functions associated with this work can be found on the Mathworks file exchange [1].

Citation Download Citation

David P. Haefner "MTF measurements, identifying bias, and estimating uncertainty", Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 1062506 (26 April 2018); https://doi.org/10.1117/12.2303974

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available