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26 April 2018 Post-optic MTF measurement using a reference optic
David P. Haefner, James Stevens, Michael Groenert, Stephen Burks, Miguel Snyder, Conor Dunn
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Proceedings Volume 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX; 106250B (2018) https://doi.org/10.1117/12.2303972
Event: SPIE Defense + Security, 2018, Orlando, FL, United States
Abstract
The Modulation Transfer Function (MTF) of an imaging device is a strong indicator of the resolution limited performance. The MTF at the system level is commonly treated as separable, with the optical MTF multiplying the postoptic (detector) MTF to give the system MTF. As new detector materials and methods have become available, and as the manufacturing of detectors has been separated from the optical system, independently measuring the MTF of the detector is of great interest. In this correspondence, a procedure for measuring the post-optic MTF of a mid-wave (3-5 micron) sampled imager is described. This is accomplished through a careful measurement of a reference optic that is later installed to allow for a final system MTF measurement. The key finding is that matching the chromatic shape of the illumination between the optic and system MTFs is critical, as in both measurements the effective MTF is scaled by the source and detector spectral shapes. This is most easily accomplished through the use of narrow bandpass filters. Our results are consistent across bandpass filter cut-on and F/number.
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David P. Haefner, James Stevens, Michael Groenert, Stephen Burks, Miguel Snyder, and Conor Dunn "Post-optic MTF measurement using a reference optic ", Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 106250B (26 April 2018); https://doi.org/10.1117/12.2303972
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KEYWORDS
Modulation transfer functions
Sensors
Optical testing
Infrared imaging
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