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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), "Title of Paper," in Polarization: Measurement, Analysis, and Remote Sensing XIII, edited by David B. Chenault, Dennis H. Goldstein, Proceedings of SPIE Vol. 10655 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510618213 ISBN: 9781510618220 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2018, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/18/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Abel, Andrew M., 0O Adams, Arielle, 0G Ahmed, Ashfaq, 0E Alenin, Andrey S., 0I, 0S Baumbauer, Carol L., 0O Baur, Tom, 05 Bermak, Amine, 0E Blackwell, Lisa, 0X Blair, Steven, 0C Boffety, Matthieu, 0J Breugnot, S., 0N Brown, Jarrod P., 0U Card, Darrell B., 0U Chenault, David B., 0M Chipman, Russell A., 03, 07, 0V Davis, Tyler, 0C Diner, David J., 07 Dubin, Matthew B., 07 Edmondson, Rich, 0X El Ketara, M., 0N Eshelman, Laura M., 0L, 0O Finney, Greg A., 0D, 0P Garcia, Missael, 0C Gehm, Michael E., 0I Germer, Thomas A., 04 Gillis, Julie M., 07 Gillis, Kendra, 0L Goldstein, Dennis, 0Y Goudail, François, 0J Gruev, Viktor, 0C, 0E Gurton, Kristan, 02 Hart, Kira A., 0V Hashimoto, Taiga, 0L Haskovic, Emir Y., 0A Hokr, Brett H., 0P, 0X Hooser, Preston, 0L Hu, Shuowen, 02 Jin, Feng, 0A Keyser, Christian K., 0G, 0U Kraemer, Michael, 05 Kruse, Andrew W., 0S Kudenov, Michael W., 08, 0T Kutcher, Susan, 0A Kyle, Dmitri C., 06 Li, Lisa W., 03 Lompado, Art, 0M Lyons, Bridget, 0Y Marinov, Radoslav, 0C Martin, Richard, 0G Moon, Benjamin, 0O Nakagawa, Wataru, 0O Nguyen, Khanh, 0G Niles, Jenny F., 0X O'Connor, Brendan T., 0T Persons, Christopher M., 0D, 0P Pezzaniti, Joseph Larry, 0M, 0X Phillips, Dane J., 0D Phipps, Daniel P., 06 Prasad, Narasimha S., 0A Rebolledo, Neil A., 06 Riesland, David W., 0O Riggan, Benjamin, 02 Roberts, Rodney G., 0U Roche, Michael, 0X Sen, Pratik, 0T Shaw, Glenn E., 0L Shaw, Joseph A., 0L, 0O Short, Nathaniel, 02 Smith, Adam M., 0M Song, Jiawei, 0I Soos, Jolanta, 0A Stanley, Bryan, 0L Tauc, Martin Jan, 0L, 0O Trivedi, Sudhir B., 0A Tyo, J. Scott, 0I, 0S Vaughn, Israel J., 0I, 0S Weiss, William, 0L Welsh, Chad M., 0U Woodard, Ethan R., 08 Wu, Dong L., 0V Yang, Ruonan, 0T Zhao, Xiaojin, 0E Conference CommitteeSymposium Chair Symposium Co-chair Conference Chairs
Conference Program Committee
Session Chairs
IntroductionA variety of current work in polarization research is contained within this volume, with an emphasis on defense and commercial sensing applications. The applications of polarimetry presented in this conference range from biometrics to navigation using polarization that originates in the sky. The field continues to mature through advances in instrumentation, modeling, and processing. These proceedings are made up of papers from seven conference sessions. An invited paper on polarimetric thermal imaging for biometrics led the first session, Measurements and Applications. This was followed on the first day of the conference by sessions on Polarization System Design and Instruments, Active Sensing, and Analysis and Simulation. The second day started with a session on Atmospheric Effect followed by a second Analysis and Simulation session. A poster session included such wide-ranging topics as polarization characterization of zebras and description of a dual wave infrared imaging polarimeter. This conference marks the twentieth year in a row that an SPIE polarization conference has been held. Polarization continues to be a subject of high interest in the optical community. Over the last fourteen years, the polarization conferences have alternated from the Optics + Photonics meeting in odd years, to the Defense, Security + Commercial Sensing meeting in even years. The nineteen prior conferences from 2017 through 1999 were documented in Proceedings of SPIE, Volumes 10407, 9853, 9613, 9099, 8873, 8364, 8160, 7672, 7461, 6972, 6682, 6240, 5888, 5432, 5158, 4819, 4481, 4133, and 3754. Previous conferences in this series included Polarization: Measurement, Analysis, and Remote Sensing held in San Diego, in 1997 (Proceedings of SPIE, Vol. 3121), and Polarization and Remote Sensing held in San Diego, in 1992 (Proceedings of SPIE, Vol. 1747). Conferences on polarization, without the specific emphasis and inclusion of the remote sensing application and entitled, Polarization Analysis and Measurement I and II (Proceedings of SPIE, Vols. 1746 and 2265), were held in San Diego, in 1992 and 1994. Earlier conferences include Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray (Proceedings of SPIE, Vols. 1317, 1990), and Polarization Considerations in Optical Systems I and II (Proceedings of SPIE, Vol. 891, in 1988, and Vol. 1166, in 1989). Our appreciation is given to our program committee members and session chairpersons for their efforts in making this conference a success, and to the contributing authors for the high quality of the papers in this volume. David B. Chenault Dennis H. Goldstein |
