Study of near-infrared imaging spectroscopy for the inspection of peeled potato tubers

Thomas Arnold; Martin DeBiasio

doi:10.1117/12.2317718

15 May 2018 Study of near-infrared imaging spectroscopy for the inspection of peeled potato tubers

Thomas Arnold, Martin DeBiasio

Proceedings Volume 10665, Sensing for Agriculture and Food Quality and Safety X; 106650Y (2018) https://doi.org/10.1117/12.2317718
Event: SPIE Commercial + Scientific Sensing and Imaging, 2018, Orlando, FL, United States

Abstract

In this paper imaging spectroscopy in the near-infrared wavelength range (900 nm-2500 nm) is evaluated for the inspection of peeled potato tubers. The high spectral resolution of the acquired data and the use of the near-infrared wavelength range make it possible to detect defects that are not visible to the human eye. The main inspection goal is the detection of potato tubers with defects that may influence the quality of French fries. The defects of interest are remains of peel, discoloration and water-, starch- or sugar distributions of the potato tubers. In this work we focus on the detection of increased sugar concentrations inside the potato which lead to an undesirable browning during the frying process. Multivariate statistical methods are used to discriminate between the pixel spectra for the defect regions and those for the remaining non-defect regions. The measurement setup and preliminary results of the data analysis are presented.

Citation Download Citation

Thomas Arnold and Martin DeBiasio "Study of near-infrared imaging spectroscopy for the inspection of peeled potato tubers", Proc. SPIE 10665, Sensing for Agriculture and Food Quality and Safety X, 106650Y (15 May 2018); https://doi.org/10.1117/12.2317718

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