Thomas Sang Hyuk Yoo,1 Andrea Fernández,2 Fernando Moreno,2 Jose Maria Saiz,2 Razvigor Ossikovski,1 Enric Garcia-Caurelhttps://orcid.org/0000-0001-8202-78101
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
We present a multimodal imaging microscope combined with a Muller polarimeter. The multimodal imaging microscope works in both real and Fourier (back-focal) planes. The Fourier plane allows the study of the angular distribution of light scattered or transmitted by the studied sample, whereas the real plane provides an image of the sample, thus allowing the study of the spatial distribution created by the latter one. A Mueller polarimeter provides a complete description of the polarimetric response of the sample. In this paper, we describe the technical characteristics of the multimodal imaging Mueller polarimetric microscope, and we provide an example of the application consisting of the characterization of the polarization of the light scattered by spheroidal microparticles which are made of transparent polymer beads deposited on a glass substrate. A thermal treatment allows transforming the beads from their original spherical shape to those of prolate spheroids. We analyze the modification of the optical response of the particles as a function of their different shape. The experimental results are complemented by numerical simulations based on the Finite-Difference Time- Domain (FDTD) method.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Thomas Sang Hyuk Yoo, Andrea Fernández, Fernando Moreno, Jose Maria Saiz, Razvigor Ossikovski, Enric Garcia-Caurel, "Multimodal imaging Mueller polarimetric microscope to study polarimetric properties of spheroidal microparticles," Proc. SPIE 10678, Optical Micro- and Nanometrology VII, 106780J (24 May 2018); https://doi.org/10.1117/12.2306170