Paper
26 July 2018 Ultrastable metrology laser at 633 nm using an optical frequency comb
Author Affiliations +
Abstract
We propose a wavelength standard for highly precise dimensional measurements. An internal-mirror helium-neon laser is offset-locked to a frequency comb line in order to carry out a secondary standard with reduced phase noise and high optical power. Additional lasers can be traced back to this secondary standard, which will enable us to disseminate the accuracy and stability to the metrology lasers of our nanopositioning and -measuring machine, the so-called NPMM-200. First measurements revealed that the stability of the secondary standard is restricted by the time standard of the optical frequency comb to a value of 2.4·10-12 (τ = 1 s), which is a significant improvement in comparison to the stability of the existing metrology lasers. In further measurements a metrology laser was locked onto the secondary standard with a relative instability of 0.6·10-15 (τ = 1000 s).
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul Köchert, Ulrike Blumröder, and Eberhard Manske "Ultrastable metrology laser at 633 nm using an optical frequency comb", Proc. SPIE 10678, Optical Micro- and Nanometrology VII, 106780S (26 July 2018); https://doi.org/10.1117/12.2306907
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Frequency combs

Laser metrology

Metrology

Laser stabilization

Helium neon lasers

Iodine cells

Gas lasers

Back to Top