Axial scanning and spherical aberration correction in confocal microscopy employing an adaptive lens

Katrin Philipp; Florian Lemke; Matthias C. Wapler; Nektarios Koukourakis; Ulrike Wallrabe; Jürgen W. Czarske

doi:10.1117/12.2307377

24 May 2018 Axial scanning and spherical aberration correction in confocal microscopy employing an adaptive lens

Katrin Philipp, Florian Lemke, Matthias C. Wapler, Nektarios Koukourakis, Ulrike Wallrabe, Jürgen W. Czarske

Proceedings Volume 10679, Optics, Photonics, and Digital Technologies for Imaging Applications V; 106790E (2018) https://doi.org/10.1117/12.2307377
Event: SPIE Photonics Europe, 2018, Strasbourg, France

Abstract

We present a fluid-membrane lens with two piezoelectric actuators that offer versatile, circular symmetric lens surface shaping. A wavefront-measurement-based control system ensures robustness against creeping and hysteresis effects of the piezoelectric actuators. We apply the adaptive lens to correct synthetic aberrations induced by a deformable mirror. The results suggest that the lens is able to correct spherical aberrations with standard Zernike coefficients between 0 μm and 1 μm, while operating at refractive powers up to about 4m^-1. We apply the adaptive lens in a custom-built confocal microscope to allow simultaneous axial scanning and spherical aberration tuning. The confocal microscope is extended by an additional phase measurement system to include the control algorithm. To verify our approach, we use the maximum intensity and the axial FWHM of the overall confocal point spread function as figures of merit. We further discuss the ability of the adaptive lens to correct specimen-induced aberrations in a confocal microscope.

Conference Presentation

Citation Download Citation

Katrin Philipp, Florian Lemke, Matthias C. Wapler, Nektarios Koukourakis, Ulrike Wallrabe, and Jürgen W. Czarske "Axial scanning and spherical aberration correction in confocal microscopy employing an adaptive lens", Proc. SPIE 10679, Optics, Photonics, and Digital Technologies for Imaging Applications V, 106790E (24 May 2018); https://doi.org/10.1117/12.2307377

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