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15 June 2018 Pushing SiC polishing technology for advanced applications
R. Geyl, H. Leplan, G. Chaussat
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Proceedings Volume 10692, Optical Fabrication, Testing, and Metrology VI; 106920X (2018) https://doi.org/10.1117/12.2314452
Event: SPIE Optical Systems Design, 2018, Frankfurt, Germany
Abstract
Since two decades Safran Reosc is developing best technique to offer polishing services of Silicon Carbide to the optical community, especially for space applications. Today we want to share with the community our efforts along various actions of progress for improving the quality of our work and our industrial efficiency in the production of SiC optical components which are key enabler of many demanding optical instruments.
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R. Geyl, H. Leplan, and G. Chaussat "Pushing SiC polishing technology for advanced applications", Proc. SPIE 10692, Optical Fabrication, Testing, and Metrology VI, 106920X (15 June 2018); https://doi.org/10.1117/12.2314452
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KEYWORDS
Silicon carbide
Polishing
Mirrors
Freeform optics
Ion beam finishing
Optical components
Surface finishing
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