Unveiling defect-related Raman mode of monolayer WS2 by resonance tip-enhanced Raman scattering 
 (Conference Presentation)

Mun Seok Jeong; Chanwoo Lee; Seung Mi Lee

doi:10.1117/12.2323453

17 September 2018 Unveiling defect-related Raman mode of monolayer WS2 by resonance tip-enhanced Raman scattering (Conference Presentation)

Mun Seok Jeong, Chanwoo Lee, Seung Mi Lee

Author Affiliations +

Proceedings Volume 10720, Nanophotonic Materials XV; 107200L (2018) https://doi.org/10.1117/12.2323453
Event: SPIE Nanoscience + Engineering, 2018, San Diego, California, United States

Abstract

Monolayer tungsten disulfide (WS2) has emerged as a material for optoelectronic applications because of its remarkable quantum yield of photoluminescence. However, the existing studies of defects in monolayer WS2 are insufficient to specifically discern Raman scattering properties caused by the defect. Here, we report that resonance tip-enhanced Raman spectroscopy imaging and correlation study with scanning tunneling microscopy can reveal defect-induced Raman modes denoted as D and D′ modes in monolayer WS2. Furthermore, our density functional theory calculations demonstrate that sulfur vacancies introduce not only the red-shifted A1g mode but also the D and D′ modes. The observed defect-related Raman modes can be utilized to evaluate the quality of monolayer WS2 and will be helpful to improve the performance of WS2 optoelectronic devices.

Conference Presentation

Citation Download Citation

Mun Seok Jeong, Chanwoo Lee, and Seung Mi Lee "Unveiling defect-related Raman mode of monolayer WS2 by resonance tip-enhanced Raman scattering (Conference Presentation)", Proc. SPIE 10720, Nanophotonic Materials XV, 107200L (17 September 2018); https://doi.org/10.1117/12.2323453

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