Characterization of an aspherical surface with null screens using exact ray tracing

Diana Castán-Ricaño; Fermín Granados-Agustín; Maximino Avendaño-Alejo; Elizabeth Percino-Zacarías; Alejandro Cornejo-Rodríguez

doi:10.1117/12.2320782

14 September 2018 Characterization of an aspherical surface with null screens using exact ray tracing

Diana Castán-Ricaño, Fermín Granados-Agustín, Maximino Avendaño-Alejo, Elizabeth Percino-Zacarías, Alejandro Cornejo-Rodríguez

Author Affiliations +

Proceedings Volume 10742, Optical Manufacturing and Testing XII; 107420Z (2018) https://doi.org/10.1117/12.2320782
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

One of the most used methods to measure the quality of optical surfaces by light transmission is the de ectometry. To implement this technique, an arbitrary ray selector is used to choose some incident rays. Measuring the intersection of the rays refracted by the surface, in a posterior detection plane perpendicular to the optical axis, the normal at the surface under test, it is determined. Whith measurement points, the shape of the surface is determined by their integration. The process is simple if the incident rays are chosen in a called null configuration, since it is expected that all refracted rays will strike a predetermined ordered array in the detection plane. To numerical calculation we using an ideal surface on this test. In order to full measuare of the surface on simulation, we used vector form of exact ray tracing. To carry out the necessary numerical simulations for a null screen, we considering a point light source and the selector placed in arbitrary position between the point source lens of the test. Some numerical simulations are shown and are compared with experimental results.

Conference Presentation

Citation Download Citation

Diana Castán-Ricaño, Fermín Granados-Agustín, Maximino Avendaño-Alejo, Elizabeth Percino-Zacarías, and Alejandro Cornejo-Rodríguez "Characterization of an aspherical surface with null screens using exact ray tracing", Proc. SPIE 10742, Optical Manufacturing and Testing XII, 107420Z (14 September 2018); https://doi.org/10.1117/12.2320782

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available