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4 September 2018 Design and characterization of a new absolute diffuse reflectance reference instrument at the NRC
Luke J. Sandilands, Eric Côté, Joanne C. Zwinkels
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Proceedings Volume 10750, Reflection, Scattering, and Diffraction from Surfaces VI; 107500G (2018) https://doi.org/10.1117/12.2322361
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States
Abstract
Absolute diffuse reflectance measurements may be carried out by means of both integrating sphere and goniometer- based methods. At the National Research Council of Canada, the scale of absolute diffuse spectral reflectance is currently realized in the UV/VIS/NIR range using the modified Sharp-Little integrating sphere method. To ex- tend the wavelength range and improve instrument performance, a new absolute reflectometer facility is presently being constructed. The new system features a monochromator-based tunable light source, interchangeable detector systems (PMT, Si, and extended InGaAs) and a custom polytetrafluoroethylene integrating sphere. Aspects of the sphere aimed at mitigating the effects of sphere asymmetry and sample recess will be discussed. Data characterizing the wavelength scale, bandpass, and linearity of the new system will also be presented.
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Luke J. Sandilands, Eric Côté, and Joanne C. Zwinkels "Design and characterization of a new absolute diffuse reflectance reference instrument at the NRC", Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500G (4 September 2018); https://doi.org/10.1117/12.2322361
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KEYWORDS
Optical spheres
Diffuse reflectance spectroscopy
Integrating spheres
Reflectivity
Reflectometry
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