Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty

Oleksandr Vasilevskyi; Volodymyr Didych; Anna Kravchenko; Maksym Yakovlev; Iryna Andrikevych; Dmytro Kompanets; Yevhen Danylyuk; Waldemar Wójcik; Askhat Nurmakhambetov

doi:10.1117/12.2501576

1 October 2018 Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty

Oleksandr Vasilevskyi, Volodymyr Didych, Anna Kravchenko, Maksym Yakovlev, Iryna Andrikevych, Dmytro Kompanets, Yevhen Danylyuk, Waldemar Wójcik, Askhat Nurmakhambetov

Author Affiliations +

Proceedings Volume 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018; 108082C (2018) https://doi.org/10.1117/12.2501576
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 2018, Wilga, Poland

Abstract

A method for estimating the level of confidence for determining the coverage factor based on metrological risks is proposed using the example of using information on tolerances and uncertainty of measuring the activity of ions, which allows to establish a reasonable interval around the measurement result, within which most of the values that can be justified are assigned to the measured value.

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Oleksandr Vasilevskyi, Volodymyr Didych, Anna Kravchenko, Maksym Yakovlev, Iryna Andrikevych, Dmytro Kompanets, Yevhen Danylyuk, Waldemar Wójcik, and Askhat Nurmakhambetov "Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty ", Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108082C (1 October 2018); https://doi.org/10.1117/12.2501576

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