Paper
6 November 2018 Accurate time-delay measurement of optical delay components based on frequency-shifted self-heterodyne spectrum
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Abstract
An electrical method is proposed for the absolute time-delay characterization of optical delay components based on the frequency-shifted self-heterodyning. The method utilizes the electrical spectrum of the heterodyne products between the delayed optical signal and the frequency-shifted optical carrier, and achieves the intrinsic absolute time-delay measurement from the notch frequencies of the spectrum at microwave region. Moreover, our method enables highresolution and wide range measurement with low-frequency electrical spectrum analysis. The theoretical analysis is supported by experimental results.
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Mengke Wang, Yixiang Hu, Shangjian Zhang, Heng Wang, Xinhai Zou, Yali Zhang, and Yong Liu "Accurate time-delay measurement of optical delay components based on frequency-shifted self-heterodyne spectrum", Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 108120E (6 November 2018); https://doi.org/10.1117/12.2500656
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KEYWORDS
Phased array optics

Optics manufacturing

Spectrum analysis

Interferometers

Optical testing

Heterodyning

Reflectometry

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