Paper
8 November 2018 Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings
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Abstract
In order to meet the experimental requirement of in-situ measurement for spectral reflectance of advanced thermal control coatings, a high accuracy in-situ measurement system for spectral reflectance of thermal control coatings of spacecraft is developed based on dual-beam spectrophotometry. The measurement wavelength range is 200 to 2500 nm, and the measurement accuracy is better than 0.5%. In the space ultraviolet radiation environmental effect test, it can realize the integrated test process of sample delivery, sampling, separation, in-situ measurement of spectral reflectance in vacuum.
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Pengsong Zhang, Bolun Zhang, Danyi Wang, Shanping Jiang, Wei Leng, Hongsong Li, and Linhua Yang "Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings", Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190P (8 November 2018); https://doi.org/10.1117/12.2503691
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KEYWORDS
Reflectivity

Ultraviolet radiation

Control systems

Spectrophotometry

Integrating spheres

Space operations

Environmental sensing

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