Spatial color-encoded phase-shifting technique for phase measuring deflectometry

Suodong Ma; Guojun Lu; Fang Dai; Chunmei Zeng; Hua Shen

doi:10.1117/12.2500564

24 July 2018 Spatial color-encoded phase-shifting technique for phase measuring deflectometry

Suodong Ma, Guojun Lu, Fang Dai, Chunmei Zeng, Hua Shen

Proceedings Volume 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018); 1082721 (2018) https://doi.org/10.1117/12.2500564
Event: Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 2018, Shanghai, China

Abstract

Free-form optics has been attracted huge interest since it can significantly improve the performance of an optical system with a simpler structure. However, optical testing for free-form surfaces is usually more difficult compared with traditional ones. Although a variety of interferometers can achieve measurements with nanometer-scale precision, it suffers from the problems of a complex system configuration, a limited measurement range and relatively high requirements of testing conditions, etc. In contrast, phase measuring deflectometry (PMD) which has the benefits of a simple system structure, a large dynamic range and a high measurement accuracy is gradually becoming a powerful tool for free-form surface testing. Nevertheless, multiple groups of fringe patterns are required to sequentially display in two orthogonal directions to obtain the corresponding surface gradients in the classical PMD measurement. Therefore, a speedy detection of free-form surfaces is generally blocked. To overcome the above shortcoming, a spatial color-encoded phase-shifting strategy is put forward for PMD to acquire absolute phases with only four color images in this paper. Experimental results demonstrate the effectiveness of the proposed method as well.

Citation Download Citation

Suodong Ma, Guojun Lu, Fang Dai, Chunmei Zeng, and Hua Shen "Spatial color-encoded phase-shifting technique for phase measuring deflectometry", Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 1082721 (24 July 2018); https://doi.org/10.1117/12.2500564

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KEYWORDS

Fringe analysis

Phase shifts

Cameras

Phase shift keying

Deflectometry

Phase retrieval

CCD cameras

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