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7 September 2018 Depth-of-field characteristic analysis of the imaging system with scattering medium
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Proceedings Volume 10834, Speckle 2018: VII International Conference on Speckle Metrology; 1083423 (2018) https://doi.org/10.1117/12.2319699
Event: SPECKLE 2018: VII International Conference on Speckle Metrology, 2018, Janów Podlaski, Poland
Abstract
The depth-of-field (DOF) characteristic of the imaging system with scattering medium is analyzed based on the analytical model of ambiguity function as a polar display of the optical transfer function (OTF) in this paper. It is indicated that the scattering medium can help re-collect more high spatial frequencies, which are normally lost with defocusing in traditional imaging systems. Therefore, the scattering medium can be considered not as an obstacle for imaging but as a useful tool to extend the DOF of the imaging system. To test the imaging properties and limitations, we performed optical experiments in a single-lens imaging system.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Meihua Liao, Dajiang Lu, Zewei Cai, Wenqi He, and Xiang Peng "Depth-of-field characteristic analysis of the imaging system with scattering medium", Proc. SPIE 10834, Speckle 2018: VII International Conference on Speckle Metrology, 1083423 (7 September 2018); https://doi.org/10.1117/12.2319699
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