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1 March 2019 Non-contact surface temperature mapping of alpha-alumina using a Raman scattering method
Juddha Thapa, Steven D. Woodruff, Michael P. Buric, Benjamin T. Chorpening
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Proceedings Volume 10919, Oxide-based Materials and Devices X; 1091921 (2019) https://doi.org/10.1117/12.2511792
Event: SPIE OPTO, 2019, San Francisco, California, United States
Abstract
Alumina ceramic is widely used as a thermocouple protector or engineering ceramic in harsh environments due to its high-temperature stability, chemical inertness, and low thermal conductivity. Because alumina is prevalent in high-temperature equipment, it is useful to understand its Raman properties to enable temperature measurement via Raman spectroscopy in these harsh-environment systems. In this paper, we report temperature mapping on the surface of high-temperature alumina ceramics via Raman spectroscopy. The ceramics studied were as cast (unpolished) to approximate use in high-temperature industrial applications. Temperature calibration equations were generated covering the range from room temperature to ~1000°C. The most accurate mathematical temperature relation used the Raman line shift of the most intense Stokes A1g peak at 418cm-1. The average standard deviation of the Raman temperature measurement was less than 5°C over the entire experimental temperature range. This method will provide accurate non-contact surface temperature measurments in harsh environments where thermal radiation and variable surface emissivity contributes significant error to simpler infrared thermometry.
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Juddha Thapa, Steven D. Woodruff, Michael P. Buric, and Benjamin T. Chorpening "Non-contact surface temperature mapping of alpha-alumina using a Raman scattering method", Proc. SPIE 10919, Oxide-based Materials and Devices X, 1091921 (1 March 2019); https://doi.org/10.1117/12.2511792
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KEYWORDS
Raman spectroscopy
Temperature metrology
Ceramics
Spectroscopy
High temperature raman spectroscopy
Raman scattering
Sensors
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