On-chip Fourier transform spectrometer on silicon-on-sapphire (Conference Presentation)

Elham Heidari; Xiaochuan Xu; Chi-Jui Chung; Ray T. Chen

doi:10.1117/12.2510519

4 March 2019 On-chip Fourier transform spectrometer on silicon-on-sapphire (Conference Presentation)

Elham Heidari, Xiaochuan Xu, Chi-Jui Chung, Ray T. Chen

Proceedings Volume 10923, Silicon Photonics XIV; 109230O (2019) https://doi.org/10.1117/12.2510519
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

The temperature of earth depends upon the balance between the energy enterring and leaving the planet. The dynamic balance has been broken by the drastical increase of greenhouse gases generated by human activities during the past 150 years. Thus, monitoring of the global emission of greenhouse gases is urgent for human beings. Fourier transform spectroscopy (FTS) in infrared wavelength range is an effective measure for this purpose. An infrared spectrum represents a ﬁngerprint of a material with absorption peaks corresponding to the vibration of the bonds of the atoms making up the material. Because each material is a unique combination of atoms, no two compounds produce the exact same infrared spectrum. Therefore, infrared spectroscopy can result in a positive identiﬁcation (qualitative analysis) of every kind of materials. In addition, the size of the peaks in the spectrum is a direct indication of the amount of material present. Compared to dispersive optics or filter based spectroscopy approaches, FTS has a few significant advantages, such as high throughput, high signal-to-noise ratio, and high sensitivity. However, the size, weight and free space optics components make FTS a laboratory only instrument demanding extensive human involvement. In this paper, we report a demonstration of an on-chip Fourier transform spectrometer near 3.3 μm wavelength on silicon-on-sapphire. Propagation loss of 5.2 dB/cm has been experimentally demonstrated for strip waveguides. The on-chip FTS comprises an array of Mach–Zehnder interferometers (MZIs) with linearly increased optical path differences. The recovery of the spectrum of an inter-band cascaded laser has been demonstrated.

Conference Presentation

Citation Download Citation

Elham Heidari, Xiaochuan Xu, Chi-Jui Chung, and Ray T. Chen "On-chip Fourier transform spectrometer on silicon-on-sapphire (Conference Presentation)", Proc. SPIE 10923, Silicon Photonics XIV, 109230O (4 March 2019); https://doi.org/10.1117/12.2510519

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
PRESENTATION

WATCH
PRESENTATION SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Fourier transforms

Spectroscopy

Silicon

Infrared radiation

Infrared spectroscopy

Chemical species

Free space optics

Show All Keywords

Keywords/Phrases

Search In:

Publication Years