Multispectral imaging system for the structural analysis of highly transparent technical surfaces

F. Rudek; Th. Puder; Ch. Taudt; P. Hartmann

doi:10.1117/12.2511081

21 May 2019 Multispectral imaging system for the structural analysis of highly transparent technical surfaces

F. Rudek, Th. Puder, Ch. Taudt, P. Hartmann

Proceedings Volume 10925, Photonic Instrumentation Engineering VI; 109250B (2019) https://doi.org/10.1117/12.2511081
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

Modern surfaces are often used as technical design elements. The high-quality appearance of these surfaces is crucial. Depending on the application, different requirements such as colour, reflectivity and resistance have to be met by the surfaces. Surface defects in highly transparent materials such as cover glasses, windows and displays affect long-term stability and distract the user. This paper shows the development of a camera-based measurement system for the investigation of structural defects in highly transparent materials. The requirements for a system like the one presented here are comparable to solution qualities of the human eye. The system is particularly suitable for the detection of surface imperfections with depths in the single µm range and widths below 50 μm as well as lengths in the mm range. At the same time, however, it can also be used to evaluate the gloss, scatter and contrast of the surface for rating the appearance quality of those. For this purpose, the setup was designed in which a sample in darkfield configuration is illuminated with an angled, multispectral LED array that can be individually switched sectorally and also uses the usual reflection approaches.

Citation Download Citation

F. Rudek, Th. Puder, Ch. Taudt, and P. Hartmann "Multispectral imaging system for the structural analysis of highly transparent technical surfaces", Proc. SPIE 10925, Photonic Instrumentation Engineering VI, 109250B (21 May 2019); https://doi.org/10.1117/12.2511081

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Air contamination

Image processing

Imaging systems

Reflection

Modulation transfer functions

Scattering

Structural analysis

Show All Keywords

Keywords/Phrases

Search In:

Publication Years