Infuence of background trends on noise power spectrum at zero frequency in radiography imaging

Eunae Lee; Dong Sik Kim

doi:10.1117/12.2512814

1 March 2019 Infuence of background trends on noise power spectrum at zero frequency in radiography imaging

Eunae Lee, Dong Sik Kim

Proceedings Volume 10948, Medical Imaging 2019: Physics of Medical Imaging; 1094841 (2019) https://doi.org/10.1117/12.2512814
Event: SPIE Medical Imaging, 2019, San Diego, California, United States

Abstract

Noise power spectrum (NPS) at zero frequency can efficiently represent noise properties of radiography detectors. However, accurately and precisely measuring the zero-frequency NPS has difficulties due to several factors. In this paper, such factors are first summarized. Among the factors, we observe unpredictable background trends, which are from unstable detector hardware, and propose a stochastic trend model. This trend inflates the measured NPS at zero frequency depending on the segment size for calculating periodograms. Influences of stochastic trends were first observed with synthetic data. A flat-panel mammography detector, which was based on a-Se photoconductor, was then used to experimentally observe the influences of background trends. We could observe that the inflated value at zero frequency increased as the segment size increased due to the stochastic trend while the true zero-frequency NPS was constant for different segment sizes.

Citation Download Citation

Eunae Lee and Dong Sik Kim "Infuence of background trends on noise power spectrum at zero frequency in radiography imaging", Proc. SPIE 10948, Medical Imaging 2019: Physics of Medical Imaging, 1094841 (1 March 2019); https://doi.org/10.1117/12.2512814

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