Translator Disclaimer
Paper
15 November 2018 Analysis of laser-induced damage in optical thin film based on ANSYS
Author Affiliations +
Proceedings Volume 10964, Tenth International Conference on Information Optics and Photonics; 109642M (2018) https://doi.org/10.1117/12.2505819
Event: Tenth International Conference on Information Optics and Photonics (CIOP 2018), 2018, Beijing, China
Abstract
The electric and thermal effects of optical thin film irradiated by Gaussian-pulsed laser are simulated with finite element method (FEM) based on the software ANSYS. The electric field intensity distribution of HfO2/SiO2 high reflective (HR) film is investigated. The transient heat-conduction model of the film is established for the calculation of temperature field of optical thin film coating. Simulation results show that, multilayer films are more prone to damage than single film, and the upper layer of HfO2 layer in the spot center may easily be damaged.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fei Wang, Kejun Chen, Fan Gao, and Xiao Yuan "Analysis of laser-induced damage in optical thin film based on ANSYS", Proc. SPIE 10964, Tenth International Conference on Information Optics and Photonics, 109642M (15 November 2018); https://doi.org/10.1117/12.2505819
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top