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13 September 1989 Readout Producibility For Z-Technology
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Abstract
Production rates of low-noise, cryogenic readout devices have been demonstrated. These devices are being produced under a MIL-Q-9858A quality system and are processed per the requirements of MIL-STD-883C. Performance, testability, reliability and producibility of the design have been equally considered throughout the development cycle. All required processes, test methodologies, and quality assurance procedures have been implemented to support production requirements.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert C. Kline, Noel D. Jolivet, and Omkarnath K. Gupta "Readout Producibility For Z-Technology", Proc. SPIE 1097, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array, (13 September 1989); https://doi.org/10.1117/12.960389
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