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14 May 2019 Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)
S. J. Ben Yoo
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Proceedings Volume 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI; 109800O (2019) https://doi.org/10.1117/12.2522152
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States
Abstract
This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.
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S. J. Ben Yoo "Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)", Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109800O (14 May 2019); https://doi.org/10.1117/12.2522152
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KEYWORDS
Integrated circuits
Interferometry
Silicon
Integrated circuit design
Interferometers
Phase interferometry
Silicon photonics
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