CMOS image sensor with off-center circular apertures for depth extraction

Byoung-Soo Choi; Jimin Lee; Sang-Hwan Kim; Jewon Lee; Junwoo Lee; Seunghyuk Chang; JongHo Park; Sang-Jin Lee; Jang-Kyoo Shin

doi:10.1117/12.2518802

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13 May 2019 CMOS image sensor with off-center circular apertures for depth extraction

Byoung-Soo Choi, Jimin Lee, Sang-Hwan Kim, Jewon Lee, Junwoo Lee, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, Jang-Kyoo Shin

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Proceedings Volume 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI; 1098011 (2019) https://doi.org/10.1117/12.2518802
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, Maryland, United States

Abstract

A CMOS image sensor with off-center circular apertures for two-dimensional (2D) and three-dimensional (3D) imaging was fabricated, and its performance was evaluated, including the results of 2D and 3D images. The pixel size, based on a four-transistor active pixel sensor with a pinned photodiode, is 2.8 μm × 2.8 μm. Disparate images as well as focused images for depth calculation can be obtained using the designed pixel pattern. The pixel pattern is composed of one white subpixel with a left-offset circular aperture, a blue pixel, a red pixel, and another white subpixel with a right-offset circular aperture. The proposed technique was verified by simulation and measurement results using a point light source. In addition, the depth image was implemented by calculating the depth information from the 2D images.

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Byoung-Soo Choi, Jimin Lee, Sang-Hwan Kim, Jewon Lee, Junwoo Lee, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, and Jang-Kyoo Shin "CMOS image sensor with off-center circular apertures for depth extraction", Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 1098011 (13 May 2019); https://doi.org/10.1117/12.2518802

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