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This PDF file contains the front matter associated with SPIE Proceedings Volume 11001, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, edited by Gerald C. Holst, Keith A. Krapels, Proceedings of SPIE Vol. 11001 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510626676

ISBN: 9781510626683 (electronic)

Published by

SPIE

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Copyright © 2019, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/19/$18.00.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Adams, Arnold, 0W

Amparan, Gabriel A., 0W

Archibald, Aaron J., 12

Bahhur, Bassam, 0Q

Baldwin, Kevin C., 10

Barnard, Kenneth J., 0T

Barrat, Catherine, 0V

Belhaire, Eric, 0D

Besnard, Véronique, 0D

Bijl, P., 0G

Bohm, Johannes, 0R

Bose-Pillai, Santasri R., 12

Brown, Andrea M., 10

Brown, David M., 10

Brown, Jarrod P., 07

Burks, Stephen D., 03, 0U

Butrimas, Steve, 14

Campbell, Georgianna, 16

Cao, YiTao, 0O

Card, Darrell B., 07

Cho, Min Ji, 19

Choi, Jun-Hyuk, 1B

Clausen, Jay L., 0N

Dammass, Gunnar, 0R

David, Asaf, 06

Doe, Joshua M., 03, 0U

Driggers, Ronald, 0E, 0H, 0M, 14

Du Bosq, Todd W., 0A, 0J

Fernandez, Fernando D., 0C

Fiorino, Steven T., 12

Fourie, Henning, 05

Fudala, N., 0E

Furxhi, Orges, 0H

Gaudiosi, D., 0E

Gemar, H., 0E

Goss, Tristan M., 05

Göttfert, Fabian, 0R

Graybeal, John J., 0A

Gross, Elad, 06

Gross, Kevin C., 0C

Gu, Jie, 0O

Guériaux, Vincent, 0D

Haefner, David P., 03, 04, 08, 0U

Halford, C., 0E

Hanna, Randall T., 10

Hawks, Michael, 0C

Haynes, T., 0L

Heisig, Konrad, 0R

Hewitt, J., 0E

Hill, Tyler A., 15

Hixson, Jonathan G., 10

Hogervorst, M. A., 0G

Holst, Gerald, 14

Hunt, Bobby R., 15

Iizuka, Hiroyuki, 18

Iler, Amber L., 15

Jacobs, Eddie L., 0Q

Jaegar, Alan, 16

Jaegar, Ryan, 16

Judd, Kelsey M., 0Z

Keβler, Stefan, 09

Kim, Chang-Won, 1B

Kim, Do-Hwi, 1B

Kim, Tae-Kuk, 1B

Krauβ, Matthias, 0R

Lambrakos, S. G., 17

Larios Huerta, Antonio, 08

Lee, Hee Chul, 19, 1A

Leonard, Kevin R., 0J

Littlejohn, Duke, 0M

Lyle, Jamie R., 16

Manville, D., 0E

Marciniak, Michael A., 0T

Matis, Gregory, 0W

Matsumiya, Takeshi, 18

Mayo, T., 17

McCrae, Jack E., 12

McHugh, Steve, 0W

Miller, Kevin J., 0J

Moore, John, 0W

Nguyen, Rachel T. T., 0A

Nicol, Fred, 0W

Nihei, Ryota, 18

Olson, C., 0E

Overbey, Lucas A., 16

Özsaraç, Seçkin, 0K

Pace, T., 0E

Pan, Jean, 16

Pérez, José, 09

Plummer, Philip J., 0T

Preece, Bradley, 0J

Qiu, YaFeng, 0O

Qiu, YunZe, 0O

Ramsey, S., 17

Redman, Brian J., 0Z

Rice, Christopher A., 12

Richards, Austin A., 0Z

Richardson, Kathleen, 14

Roberts, Rodney G., 07

Ruane, Martin, 16

Rucci, Michael A., 15

Scopatz, Stephen, 0V

Shelton, D., 0E

Shin, Young Bong, 1A

Short, Robert, 0E, 0M

Soel, Michael A., 02

Steiner, Dov, 09

Steward, Bryan J., 0C

Tanaka, Yutaka, 18

Teaney, Brian P., 03

Tener, G., 0E

Theisen, M., 0E

Thornton, Michael P., 0Z

Van Epps, Todd, 16

Vicedomine, Emily A., 08

Viger, R., 17

Viljoen, Johan W., 05

Wagner, Michael C., 07

Workman, Austin K., 0N

Zhang, Lei, 0H

Conference Committee

Symposium Chairs

Jay Kumler, JENOPTIK Optical Systems, LLC (United States)

Ruth L. Moser, Air Force Research Laboratory (United States)

Symposium Co-chair

John M. Pellegrino, Georgia Institute of Technology (United States)

Conference Chairs

Gerald C. Holst, JCD Publishing (United States)

Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Conference Program Committee

Gisele Bennett, Florida Institute of Technology (United States)

Piet Bijl, TNO Defence, Security and Safety (Netherlands)

Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

James A. Dawson, Dynetics, Inc. (United States)

Russell M. Drake, Raytheon Network Centric Systems (United States)

Ronald G. Driggers, St. Johns Optical Systems (United States)

Richard L. Espinola, U.S. Naval Research Laboratory (United States)

Orges Furxhi, St. Johns Optical Systems (United States)

David P. Haefner, U.S. Army RDECOM CERDEC NVESD (United States)

Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Alan Irwin, Santa Barbara Infrared, Inc. (United States)

Eddie L. Jacobs, University of Memphis (United States)

Jony Liu, U.S. Army Research Laboratory (United States)

Terrence S. Lomheim, The Aerospace Corporation (United States)

Endre Repasi, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

Joseph P. Reynolds, U.S. Army RDECOM CERDEC NVESD (United States)

Nicolas Rivière, ONERA (France)

Michael A. Soel, FLIR Systems, Inc. (United States)

Curtis M. Webb, L-3 Technologies Cincinnati Electronics (United States)

Session Chairs

  • 1 Modeling I

    Gerald C. Holst, JCD Publishing (United States)

    Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • 2 Modeling II

    Orges Furxhi, IMEC USA - Florida (United States)

    David P. Haefner, U.S. Army RDECOM CERDEC NVESD (United States)

    Nicolas Rivière, ONERA (France)

  • 3 Modeling III

    Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

    Eddie L. Jacobs, The University of Memphis (United States)

    Terrence S. Lomheim, The Aerospace Corporation (United States)

    Joseph P. Reynolds, U.S. Army RDECOM CERDEC NVESD (United States)

  • 4 Modeling IV

    Richard L. Espinola, U.S. Naval Research Laboratory (United States)

    Michael A. Soel, FLIR Systems, Inc. (United States)

  • 5 Modeling V

    Russell M. Drake, Raytheon Network Centric Systems (United States)

    Ronald G. Driggers, IMEC USA - Florida (United States)

    Piet Bijl, TNO Defence, Security and Safety (Netherlands)

  • 6 Modeling VI

    Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    James A. Dawson, Dynetics, Inc. (United States)

    Gisele Bennett, Florida Institute of Technology (United States)

  • 7 Test I

    Curtis Webb, L-3 Technologies Cincinnati Electronics (United States)

    Alan Irwin, Santa Barbara Infrared, Inc. (United States)

  • 8 Test II

    Curtis Webb, L-3 Technologies Cincinnati Electronics (United States)

    Alan Irwin, Santa Barbara Infrared, Inc. (United States)

  • 9 Atmospheric Effects I

    Richard L. Espinola, U.S. Naval Research Laboratory (United States)

    Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Eric J. Kelmelis, EM Photonics, Inc. (United States)

  • 10 Atmospheric Effects II

    Richard L. Espinola, U.S. Naval Research Laboratory (United States)

    Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Eric J. Kelmelis, EM Photonics, Inc. (United States)

Introduction

This is the 30th year for our conference, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing. Mike Soel provided an excellent walk down memory lane with is paper “30 years of value engineering to the IR community.” One of us (GCH) received an award for chairing all 30 conferences. There he is with the conference committee.

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For time to time we have joint session with other conferences. We again teamed up with the Long-range Imaging conference chaired by Eric Kelmelis.

In 2016, our conference committee created two BEST PAPER awards. One is based upon the presentation (selected by the conference committee) and the other the most downloaded in the first 3 months after publication. The most downloaded paper represents the current hot topic. We recommend readers review these outstanding papers. The 2016 and 2017 papers are listed in the Introduction to SPIE Proceeding volume 10625 (2018).

2018

Best presentation

David P. Haefner, “MTF measurements, identifying bias, and estimating uncertainty,” Proc. SPIE 10625, paper 1062506 (2018).

Most downloaded paper (first 3 months after publication)

Robert Nicholas, Ronald Driggers, David Shelton and Orges Furxhi, “Infrared search and track performance estimates for detection of commercial unmanned aerial vehicles,” Proc. SPIE 10625, paper 106250Y (2018).

2019

Best presentation

Kevin J. Miller, Bradley Preece. Todd du Bosq, Kevin Leornard, “A data-constrained algorithm for the emulation of long-range-turbulence-degraded video,” Proc. SPIE 11001, paper 110010J (2019).

Most downloaded paper (first 3 months after publication): Brian P. Teaney, David P. Haefner, Joshua M. Doe, “Evaluating the performance of reflective band imaging systems: a tutorial,” Proc. SPIE 11001, paper 1100103 (2019).

Thank you to all who presented, the attendees, our excellent conference committee, and SPIE support team.

Gerald C. Holst

Keith A. Krapels

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11001", Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 1100101 (22 July 2019); https://doi.org/10.1117/12.2538240
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