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14 May 2019 30 years of value engineering to the IR community
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Abstract
The SPIE Infrared Imaging Systems: Design, Analysis, Modeling and Testing subconference is now holding its 30th annual conference – one of the longest running conferences in the SPIE technical conference series. Over the years, this working group, it’s Gov’t, Industry and academic participants have shared technical innovations on all aspects of IR and EO design approaches, analysis methods, modeling and simulation tools and extensive discussions on a wide range of testing methods. The wealth of information, training and collaboration resulting from this conference has helped form, shape and grow the careers of sensor systems engineers around the world, fostering new technology growth and proliferation to benefit us all. This presentation will look back at some of the significant highlights of the conference, notable technical concepts and in some cases their evolution, key papers, and show how our industry has significantly benefitted from this SPIE Gem.
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Michael A. Soel "30 years of value engineering to the IR community", Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 1100102 (14 May 2019); https://doi.org/10.1117/12.2520503
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