Through display measurement of signal intensity transfer function and noise for thermal systems

Stephen D. Burks; David P. Haefner; Joshua M. Doe

doi:10.1117/12.2518146

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14 May 2019 Through display measurement of signal intensity transfer function and noise for thermal systems

Stephen D. Burks, David P. Haefner, Joshua M. Doe

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Proceedings Volume 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX; 110010U (2019) https://doi.org/10.1117/12.2518146
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, Maryland, United States

Abstract

Typical thermal system performance measurements include measurements from a sensor’s digital or analog output while system performance characterizations are based upon measurements from those outputs while characterizing the performance of the display separately. This can be a improper assumption because additional signal processing could occur between the sensor test port and the display. Recent research has focused on the characterization of thermal system displays for better model fidelity. The next evolution in this research is to introduce a means for characterizing thermal system signal intensity transfer (SITF) and three dimensional noise (3DN) performance for systems that have a display as well as a known digital output. This correspondence presents an attempted means to characterize the SITF and 3DN performance for a thermal system when only using a display as the output.

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Stephen D. Burks, David P. Haefner, and Joshua M. Doe "Through display measurement of signal intensity transfer function and noise for thermal systems", Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110010U (14 May 2019); https://doi.org/10.1117/12.2518146

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