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24 April 2019 Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam
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Abstract
We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.
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F. Bonfigli, N. J. Hartley, Y. Inubushi, M. Koenig, T. Matsuoka, S. Makarov, R. M. Montereali, E. Nichelatti, N. Ozaki, M. Piccinini, S. Pikuz, T. Pikuz, D. Sagae, M. A. Vincenti, M. Yabashi, and T. Yabuuchi "Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam", Proc. SPIE 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII, 110350N (24 April 2019); https://doi.org/10.1117/12.2520907
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