Structural, morphological, and optical studies of Rutile-phase TiO2 rods grown on F:SnO2-coated glass substrate by hydrothermal chemical bath deposition

Crispin M. Mbulanga; Zelalem N. Urgessa; Stive R. Tankio Djiokap; Japie A. A. Engelbrecht; Richard Betz; Johannes R. Botha

doi:10.1117/12.2501108

24 January 2019 Structural, morphological, and optical studies of Rutile-phase TiO₂ rods grown on F:SnO₂-coated glass substrate by hydrothermal chemical bath deposition

Crispin M. Mbulanga, Zelalem N. Urgessa, Stive R. Tankio Djiokap, Japie A. A. Engelbrecht, Richard Betz, Johannes R. Botha

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Proceedings Volume 11043, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems; 110430R (2019) https://doi.org/10.1117/12.2501108
Event: Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2018, Skukuza, South Africa

Abstract

Structural, morphological and optical studies of rutile-phase TiO₂ rods, grown on F:SnO₂-coated glass substrates, using hydrothermal chemical bath deposition, are reported. The methods used to determine the optical properties of a semiconductor-on-substrate two-medium system have been successfully applied to the following three-medium structure: vertically well-aligned rods of TiO₂, an F:SnO₂ (FTO) conducting thin film and a glass substrate. Reflectance fringe measurements yielded the thickness of the TiO₂ layer to be d = 4.2 μm, which agreed well with the length of rods observed using SEM. The F:SnO₂ thickness of 569 nm measured from reflectance fringe spacings also agreed with SEM measurements. A room temperature absorption edge of E_g = 2.90 eV was obtained for the top layer of TiO₂ rods, which is similar to other values reported for TiO₂. A room temperature absorption edge of E_g = 3.56 eV was determined for the conducting F:SnO₂ layer.

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Crispin M. Mbulanga, Zelalem N. Urgessa, Stive R. Tankio Djiokap, Japie A. A. Engelbrecht, Richard Betz, and Johannes R. Botha "Structural, morphological, and optical studies of Rutile-phase TiO₂ rods grown on F:SnO₂-coated glass substrate by hydrothermal chemical bath deposition", Proc. SPIE 11043, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 110430R (24 January 2019); https://doi.org/10.1117/12.2501108

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KEYWORDS

Glasses

Reflectivity

Absorption

Refractive index

Scanning electron microscopy

Thin films

Transparent conductors

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