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7 March 2019 Research of the temperature influence on the error rate of incremental optical-electronic encoders of linear displacements based on raster structures
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Proceedings Volume 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation; 1105314 (2019) https://doi.org/10.1117/12.2518102
Event: 10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018), 2018, Kunming, China
Abstract
The currently existing incremental optical-electronic linear displacement encoders (OELDE) use raster conjugation, which allows for the measurement of linear motion with high accuracy by means of the conversion of optical signals in the opto-electronic path. In such devices, informative signals constantly undergo transformations associated with their processing. Variable environmental factors, especially temperature, have a harmful effect on signal conversion processes and cause additional error. The aim is to analyze the results of theoretical and experimental studies of the additional error from the effect of changes in ambient temperature on incremental OELDE’s. Analyzing the effect of temperature on the course of information transformation, it is possible to divide the main emerging partial components of the additional error into two groups: - errors due to changes in the relative spatial position of the elements of the OELDE; - errors due to changes in parameters and characteristics of elements of the OELDE.
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Sergey V. Mednikov, Alexandr S. Vasilev, Anastasia A. Blokhina, Maksim A. Kleshchenok, Ivan S. Nekrylov, and Igor A. Konyakhin "Research of the temperature influence on the error rate of incremental optical-electronic encoders of linear displacements based on raster structures", Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 1105314 (7 March 2019); https://doi.org/10.1117/12.2518102
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