Full-field, high-frequency, heterodyne interferometry for dynamic metrology based on phase detection using a modified time-of-flight camera

John B. Mitchell; Gareth Wyn Roberts; Paul C. T. Rees

doi:10.1117/12.2525827

21 June 2019 Full-field, high-frequency, heterodyne interferometry for dynamic metrology based on phase detection using a modified time-of-flight camera

John B. Mitchell, Gareth Wyn Roberts, Paul C. T. Rees

Author Affiliations +

Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 110560U (2019) https://doi.org/10.1117/12.2525827
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

We describe a full field heterodyne interferometry system where the object beam is shifted by a high frequency with respect to the reference beam. The optical path difference between the object and reference beam is encoded in the phase of the envelope of the interference signal which is at the difference frequency. Conventionally, high frequency heterodyne interferometry is restricted to measurement of a single (or a few) point(s) as is the case in displacement measuring interferometers for precision machine tool axis feedback. This is because of the problem of demodulating the signal phase simultaneously for many pixels comprising a full-field image. This problem is overcome here by exploiting the capability of the special pixel structure employed in a Time of Flight (ToF) camera. This structure enables the measurement of the envelope phase of an optical signal at every pixel with respect to an electronic reference at the same frequency. ToF cameras are designed to measure the distance to an object in its field of view by detecting the phase delay, due to time of flight, of reflected light from a modulated source synchronized to the camera. In the described experimental interferometer, a Twyman-Green architecture is used with an acousto-optic modulator to produce interfering beams with a difference frequency of 20MHz. The image detector is a modified ToF camera based on a Texas Instruments OPT8241 sensor. The interferometer directly outputs a wrapped optical phase map with 12-bit resolution (equivalent OPD resolution 0.15 nm) at greater than 50 frames per second with no post-processing. The phase reconstruction is highly insensitive to the reference/object beam intensity ratio or to environmental noise.

Conference Presentation

Citation Download Citation

John B. Mitchell, Gareth Wyn Roberts, and Paul C. T. Rees "Full-field, high-frequency, heterodyne interferometry for dynamic metrology based on phase detection using a modified time-of-flight camera", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560U (21 June 2019); https://doi.org/10.1117/12.2525827

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