Influence of test bench parameters on determination of CMOS -cameras feature

Dinh B. Minh; Valery V. Korotaev; Sergey N. Yaryshev; Anton A. Maraev; Ivan S. Nekrylov; Anna V. Vasileva

doi:10.1117/12.2526107

21 June 2019 Influence of test bench parameters on determination of CMOS -cameras feature

Dinh B. Minh, Valery V. Korotaev, Sergey N. Yaryshev, Anton A. Maraev, Ivan S. Nekrylov, Anna V. Vasileva

Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 110562H (2019) https://doi.org/10.1117/12.2526107
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

Digital video cameras are the main component of both visual and measuring optoelectronic devices. The parameters and characteristics of video cameras can be varied significantly for each instance. Since the characteristics of a video camera mostly determine the characteristics of the entire device, it is important to monitor them. This will ensure the stability of the characteristics of video cameras, and consequently, image stability and improvement of measurement accuracy in the case of using video cameras in optical-electronic measuring devices. This paper presents an experimental test bench designed to study the parameters of serial video cameras based on CMOS matrix photodetectors. Method are proposed for determining such camera parameters as irregularity of photosensitivity around the site, as well as change in the signal-to-noise ratio with variations in the level of exposure, exposure time and amplifier coefficient.

Citation Download Citation

Dinh B. Minh, Valery V. Korotaev, Sergey N. Yaryshev, Anton A. Maraev, Ivan S. Nekrylov, and Anna V. Vasileva "Influence of test bench parameters on determination of CMOS -cameras feature", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110562H (21 June 2019); https://doi.org/10.1117/12.2526107

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