Impedance Spectroscopy (IS) is a non-destructive characterization technique that has been extensively applied to different electronic devices, such as LEDs, photodiodes and solar cells. This technique provides access to valuable information about dynamical mechanisms (minority carrier recombination, diffusion, etc.) taking place in the different layers of the device. Besides, material and device parameters, such as dielectric constant, built-in potential, and carrier mobilities can be extracted. Impedance spectra results from applying a small AC signal over a steady DC bias and measuring the resulting small AC current over a frequency range, typically from 1 Hz to 1 MHz, 𝑍(jω) = VAC/1AC. The Nyquist plot of the complex impedance (imaginary part vs real part) generally presents one or more features (mainly semicircles), depending on the number of mechanisms governing the device. Fitting an electrical equivalent circuit to the complete impedance spectra provides parameters related to each feature (resistance and capacitance). In this work, IS has been used to characterize organic and perovskite solar cells (OSCs and PSCs, respectively). Measurements have been performed in dark and under illumination conditions at different bias (from 0 V to VOC). A simple circuital model containing two resistances and two capacitances has been used to fit the measured IS spectra. The interpretation of extracted circuital parameters and its relationship with the physical model of the device will be discussed.