Recovering the phase of radiation is of general interest in material and biomedical science, and in nanotechnology. Commercial interferometers have been widely used in a variety of applications, if equipped with a spatial light modulator or a computer generate hologram, theoretically the interferometer can measure a variety of surface objects. At present, the new non-interferometric quantitative phase recovery method based on Transport of Intensity Equations (TIE) is widely used in the field of microstructure measurement and bioimaging. Compared with interferometric measurement, the Transport of Intensity Equations does not need additional reference light, and has good ability of anti-vibration. In this paper, the ubiquitous interferometer and the new d’Nanoimager based on the Transport of Intensity Equations (TIE) are compared with respect to measuring larger objects of different profiles. These two methods are compared with respect of their accuracy and resolution of measurement and speed of acquiring data and other experimental consideration. In addition, a large number of subjects are selected for specific applications include flat surface such as the display screen of smartphones, to lens testing both spherical and cylindrical lenses and specific application such as corrosion pitting of aluminum disks. The comparative advantages and dis-advantages of the two methods are explored, as well as their application.