Paper
9 September 2019 Three-dimensional shape measurement of an ellipsoidal mirror by industrial x-ray computed tomography
Satsuki Shimizu, Yoko Takeo, Gota Yamaguchi, Yutaka Ohtake, Yukie Nagai, Hidekazu Mimura
Author Affiliations +
Abstract
An ellipsoidal mirror is a soft X-ray reflective focusing device. We are developing precise ellipsoidal mirrors based on an electroforming process. To improve the fabrication process, three-dimensional shape measurements with a high accuracy are required. In this research we develop a method to measure ellipsoidal shapes by industrial X-ray computed tomography (CT). The X-ray CT process consists of measuring the mirror shape and determining the parameters of the ellipsoid. We also evaluate the reproducibility of X-ray CT measurements and clarify that the accuracy is at the 5-m level.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satsuki Shimizu, Yoko Takeo, Gota Yamaguchi, Yutaka Ohtake, Yukie Nagai, and Hidekazu Mimura "Three-dimensional shape measurement of an ellipsoidal mirror by industrial x-ray computed tomography", Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090I (9 September 2019); https://doi.org/10.1117/12.2530321
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

X-ray computed tomography

X-rays

Reflectivity

RELATED CONTENT

Prototyping iridium coated mirrors for x-ray astronomy
Proceedings of SPIE (May 31 2017)
Ion transmission to the focal plane of the Chandra X...
Proceedings of SPIE (December 13 2000)
Metrology in the soft x ray range from EUV...
Proceedings of SPIE (September 25 2008)
Efficiency Of X-Ray Reflection Gratings
Proceedings of SPIE (December 21 1988)

Back to Top