Design optimization of a confocal x-ray fluorescence imaging capability for XFM and SRX at NSLS-II

Yuan Gao; Andrew Kiss; Ryan Tappero; Benjamin Stripe; Wenbing Yun; Yong S. Chu

doi:10.1117/12.2528026

Translator Disclaimer

9 September 2019 Design optimization of a confocal x-ray fluorescence imaging capability for XFM and SRX at NSLS-II

Yuan Gao, Andrew Kiss, Ryan Tappero, Benjamin Stripe, Wenbing Yun, Yong S. Chu

Author Affiliations +

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 1111204 (2019) https://doi.org/10.1117/12.2528026
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

We propose a novel confocal x-ray fluorescence (XRF) imaging capability at the X-ray Fluorescence Microprobe (XFM) and Submicron Resolution X-ray Spectroscopy (SRX) beamlines of the National Synchrotron Light Source II (NSLS-II). Comparing to the conventional XRF tomography, this method can image a local region of interest within tens of minutes instead of hours. We will also present the optimized design of the confocal optic and estimated imaging resolution and throughput, based on the real parameters of the beamline photon delivery systems and the proposed confocal setup.

Conference Presentation

Citation Download Citation

Yuan Gao, Andrew Kiss, Ryan Tappero, Benjamin Stripe, Wenbing Yun, and Yong S. Chu "Design optimization of a confocal x-ray fluorescence imaging capability for XFM and SRX at NSLS-II", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 1111204 (9 September 2019); https://doi.org/10.1117/12.2528026

ACCESS THE FULL ARTICLE