Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

Andreas Schropp; Dennis Brückner; Jessica Bulda; Gerald Falkenberg; Jan Garrevoet; Johannes Hagemann; Frank Seiboth; Kathryn Spiers; Frieder Koch; Christian David; Marianna Gambino; Martin Veselý; Florian Meirer; Christian G. Schroer

doi:10.1117/12.2528422

9 September 2019 Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, Christian G. Schroer

Author Affiliations +

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 1111208 (2019) https://doi.org/10.1117/12.2528422
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

To date, compound refractive X-ray lenses made out of Beryllium (Be CRLs) have been seldom applied for full-field microscopy with high spatial resolution, which was probably due to residual aberrations of these optics. However, in combination with the recent development of made-to-measure phase plates, the typical spherical aberration of beryllium compound refractive lenses (Be CRLs) can now be completely removed. In this way, distortion-free images of a sample are obtained, which is especially important for tomographic applications. First full-field imaging experiments with aberration-corrected Be CRLs were carried out at beamline P06 at the synchrotron radiation X-ray source PETRA III (DESY Hamburg, Germany). In order to maximize the magnification of the X-ray microscope for full-field microscopy, the full length of the beamline combining the micro- and nanohutch was utilized, enabling a large sample-to-detector distance. In this contribution, we present first imaging results, demonstrating the potential of Be CRLs for direct high-resolution X-ray tomography.

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Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, and Christian G. Schroer "Full-field hard X-ray microscopy based on aberration-corrected Be CRLs", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 1111208 (9 September 2019); https://doi.org/10.1117/12.2528422

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