Retardance parameters measurements by employing a rotating polarizer-analyzer polarimeter

Humberto Macias-Mendoza; David I. Serrano-García; Jorge L. Flores; Guillermo García Torales; Azael Mora-Núñez; Héctor Santiago Hernández; Geliztle A. Parra Escamilla; Francisco J. Cervantes Lozano

doi:10.1117/12.2529659

6 September 2019 Retardance parameters measurements by employing a rotating polarizer-analyzer polarimeter

Humberto Macias-Mendoza, David I. Serrano-García, Jorge L. Flores, Guillermo García Torales, Azael Mora-Núñez, Héctor Santiago Hernández, Geliztle A. Parra Escamilla, Francisco J. Cervantes Lozano

Author Affiliations +

Proceedings Volume 11132, Polarization Science and Remote Sensing IX; 1113213 (2019) https://doi.org/10.1117/12.2529659
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

In this work, we proposed the usage of a rotating polarizer-analyzer polarimeter to retrieve retardance parameters of a sample by treating it as an elliptical retarder that can be characterized by three parameters: total retardance, fast axis orientation and an ellipticity related parameter. By employing the Mueller matrix approach, we developed the demodulation algorithm to retrieve each parameter with the association of the Fourier series analysis. We present experimental results considering dextrose concentrations diluted in distilled water scaling in a range from 30mg/dl to 45mg/dl. For comparison purposes, we employed the method of rotating an analyzer and compare the optical activity variation for both methods.

Citation Download Citation

Humberto Macias-Mendoza, David I. Serrano-García, Jorge L. Flores, Guillermo García Torales, Azael Mora-Núñez, Héctor Santiago Hernández, Geliztle A. Parra Escamilla, and Francisco J. Cervantes Lozano "Retardance parameters measurements by employing a rotating polarizer-analyzer polarimeter", Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 1113213 (6 September 2019); https://doi.org/10.1117/12.2529659

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available