Open Access Paper
2 July 2019 Industry training on on-wafer optoelectronic vector network analysis
Author Affiliations +
Proceedings Volume 11143, Fifteenth Conference on Education and Training in Optics and Photonics: ETOP 2019; 111431Z (2019) https://doi.org/10.1117/12.2523481
Event: Fifteenth Conference on Education and Training in Optics and Photonics: ETOP 2019, 2019, Quebec City, Quebec, Canada
Abstract
In today’s fast-paced world, efficient industrial workplace training has economic implications in any technology firm. Employees are required to learn technical skills and acquire proficiency quickly, regardless of the extent of prior experience. In this paper, we outline a methodology to train technical staff, which could include engineers, technicians, and/or operators, on vector network analysis in the context of photonics companies involved in the characterization of optoelectronic devices, particularly photonic integrated circuits. The acquired skills span electronic, microwave, and optical domains, but assume only basic prior electrical knowledge and no microwave or optics background. Focusing on on-wafer S-parameter characterization of optoelectronic components or modules, we first describe training in various laboratory tasks, including instrument calibration, device handling, probing, optical waveguide alignment, and taking measurements. Then, we elaborate on some relevant skills for processing and analyzing measured data. We identify relevant theory where appropriate, in a way suited for industry needs as opposed to academic settings. In this manner, staff learn sufficiently to be able to level their skills swiftly to get the job done. Much of the pedagogical details stem from our own industrial experiences as a photonic wafer manufacturing company, where we have trained team members of various technical backgrounds. The pedagogy can be applied to other technical areas, and it is hoped that the ideas in this paper will be of value to both nascent and established organizations.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicholas H. L. Wong, Brian Pile, and Junqiang Zhou "Industry training on on-wafer optoelectronic vector network analysis", Proc. SPIE 11143, Fifteenth Conference on Education and Training in Optics and Photonics: ETOP 2019, 111431Z (2 July 2019); https://doi.org/10.1117/12.2523481
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KEYWORDS
Calibration

Waveguides

Semiconducting wafers

Optoelectronics

Photodetectors

Optoelectronic devices

Photonic integrated circuits

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