CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11189 > Article
Paper
18 November 2019 A planar pattern based calibration method for high precision structured laser triangulation measurement
Ruiming Chen, Xinghui Li, Xiaohao Wang, Jianxiong Li, Gaopeng Xue, Qian Zhou, Kai Ni
Author Affiliations +
Proceedings Volume 11189, Optical Metrology and Inspection for Industrial Applications VI; 1118914 (2019) https://doi.org/10.1117/12.2537757
Event: SPIE/COS Photonics Asia, 2019, Hangzhou, China
Abstract
A flexible calibration method with high precision was proposed for calibration of structured laser triangulation in the applications of 3D reconstruction and point cloud processing. The camera coordinate system was chosen as the ultimate reference coordinate. In this calibration process, be required only a planar pattern placed at different orientations and positions for obtainment of the camera intrinsic parameters. And then two or more non-coplanar sets of three collinear points were calculated for the laser projection plane coefficients. A line laser triangulation measurement system is established, consisted of laser diode, cylindrical lens module and camera imaging system. Experimental results based on the constructed structured laser triangulation system revealed that accuracy of the profile measurement is less than ±0.005mm, which can meet the majority of industrial inspection applications.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Ruiming Chen, Xinghui Li, Xiaohao Wang, Jianxiong Li, Gaopeng Xue, Qian Zhou, and Kai Ni "A planar pattern based calibration method for high precision structured laser triangulation measurement", Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 1118914 (18 November 2019); https://doi.org/10.1117/12.2537757
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration
Cameras
Imaging systems
Laser applications
Laser systems engineering
Semiconductor lasers
3D modeling
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top