Paper
30 December 2019 Multiple-pass configuration for improved reflection mode confocal system
Author Affiliations +
Abstract
The concept of using multiple-pass technique to improve the axial resolution of a reflection mode confocal system is presented. The propose technique allows further diversion on the given out-of-focus rays from entering the pinhole, imposing a more stringent limit for rays around the in-focus region to be detected as confocal signal. The feasibility of the propose technique was experimentally examined. The comparison of the full width at half maximum (FWHM) of the normalized intensity profiles shows that the axial scanning resolution achieved by the proposed technique is twofold of that of the conventional technique.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. U. Hii "Multiple-pass configuration for improved reflection mode confocal system", Proc. SPIE 11200, AOS Australian Conference on Optical Fibre Technology (ACOFT) and Australian Conference on Optics, Lasers, and Spectroscopy (ACOLS) 2019, 1120020 (30 December 2019); https://doi.org/10.1117/12.2539982
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Confocal microscopy

Mirrors

Reflection

Signal detection

Beam delivery

Beam splitters

Geometrical optics

Back to Top