Paper
16 October 2019 Fourier ptychography: effectiveness of image classification
Author Affiliations +
Proceedings Volume 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019); 112050G (2019) https://doi.org/10.1117/12.2548097
Event: Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 2019, Phuket, Thailand
Abstract
In this research, we systematically investigated the image classification accuracy of Fourier Ptychography Microscopy (FPM). Multiple linear regression of image classification accuracy (dependent variable), PSNR and SSIM (independent variables) was performed. Notebly, results show that PSNR, SSIM, and image classification accuracy has a linear relationship. It is therefore feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that image classification accuracy of the FPM is not universally significantly differed from the lower resolution image under the higher numerical aperture (NA) condition. The difference is yet much more pronounced under the lower NA condition.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongbo Zhang, Lin Wang, WenJing Zhou, ZhiJuan Hu, Peter W. M. Tsang, and Ting-Chung Poon "Fourier ptychography: effectiveness of image classification", Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 112050G (16 October 2019); https://doi.org/10.1117/12.2548097
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KEYWORDS
Image classification

Image resolution

Image processing

Convolution

Image quality

Neural networks

Light emitting diodes

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