Translator Disclaimer
Paper
20 December 2019 Accurate x-ray source dimension measurement by the spherically bent crystal imaging system
Author Affiliations +
Proceedings Volume 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019); 1120906 (2019) https://doi.org/10.1117/12.2542256
Event: Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 2019, Xi'an, China
Abstract
X-ray sources are widely used in non-destructive testing applications. The focal spot shape and size of an X-ray source are important factors that influence the resolution and contrast of images. A monochromatic imaging method using a spherically bent crystal is proposed to measure the focal spot size of X-ray sources. The natural emission spectral lines of the target material are imaged to distinguish the target from the substrate. Thus, the fine structures of the focal spot can be measured combined with high spatial resolution. With a backlight imaging experiment, the imaging system achieves a high spatial resolution of ~10 μm over a large field of view of 2.5 mm with a narrow energy band of 2 eV at 8.05 keV. The X-ray focal spot size of a laboratory X-ray source with a Cu anode is measured using the spherically bent crystal imaging system and a pinhole camera respectively. The spherically bent crystal imaging system provides high spatial resolution and additional details for the focal spot. Thus, the monochromatic imaging method is applicable for the accurate X-ray source dimension measurement.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin Shen, Weiquan Zhang, Guibin Zan, Zhanglang Xu, Xuewei Du, and Qiuping Wang "Accurate x-ray source dimension measurement by the spherically bent crystal imaging system", Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 1120906 (20 December 2019); https://doi.org/10.1117/12.2542256
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

A study of EM failure in a micro scale Pb...
Proceedings of SPIE (September 11 2014)
High-accuracy x-ray imaging: screen, lens, and CCD
Proceedings of SPIE (September 14 1993)
PbI2 for high-resolution digital x-ray imaging
Proceedings of SPIE (October 06 1999)
CdZnTe arrays for astrophysics applications
Proceedings of SPIE (July 07 1997)

Back to Top