Flatness of planar Fabry-Pérot cavities: a critical parameter for high sensitivity sensors for photoacoustic imaging (Conference Presentation)

Dylan Marques; James A. Guggenheim; Rehman Ansari; Edward Z. Zhang; Paul C. Beard; Peter R. T. Munro

doi:10.1117/12.2548971

20 April 2020 Flatness of planar Fabry-Pérot cavities: a critical parameter for high sensitivity sensors for photoacoustic imaging (Conference Presentation)

Dylan Marques, James A. Guggenheim, Rehman Ansari, Edward Z. Zhang, Paul C. Beard, Peter R. T. Munro

Author Affiliations +

Proceedings Volume 11240, Photons Plus Ultrasound: Imaging and Sensing 2020; 112400V (2020) https://doi.org/10.1117/12.2548971
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

The manufacturing process of high sensitivity planar Fabry-Pérot (FP) sensors for Photoacoustic (PA) imaging is very challenging and typically results in non-uniformities of the cavity thickness. The non-uniformities leads to an angular tilt between the two mirrors forming the FP sensor. Based on a full wave model, we study the impact of this tilt which reveals a strong dependence between optical sensitivity and degree of tilt. As an example, an angular tilt as small as 0.1 mrad can reduce the sensitivity by 75%. To achieve high sensitivity FP sensors, high mirror reflectivities are required which in turn increases the impact of the non-uniformities in the cavity thickness. Therefore, the optimal design of the sensors is dependent on the manufacturing precision.

Conference Presentation

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Dylan Marques, James A. Guggenheim, Rehman Ansari, Edward Z. Zhang, Paul C. Beard, and Peter R. T. Munro "Flatness of planar Fabry-Pérot cavities: a critical parameter for high sensitivity sensors for photoacoustic imaging (Conference Presentation)", Proc. SPIE 11240, Photons Plus Ultrasound: Imaging and Sensing 2020, 112400V (20 April 2020); https://doi.org/10.1117/12.2548971

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