Development of high sensitivity quantitative phase microscopy for label-free imaging of nanoscale dynamics

Yujie Nie; Yijin Wang; Renjie Zhou

doi:10.1117/12.2547062

14 February 2020 Development of high sensitivity quantitative phase microscopy for label-free imaging of nanoscale dynamics

Yujie Nie, Yijin Wang, Renjie Zhou

Author Affiliations +

Proceedings Volume 11249, Quantitative Phase Imaging VI; 112491W (2020) https://doi.org/10.1117/12.2547062
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

We propose and demonstrate a high sensitivity common-path quantitative phase microscopy (QPM) technique that can be used to detect nanoscale dynamics with millisecond temporal resolution. Our system is based on a transmission-mode diffraction phase microscope that is implemented with a high electron well-depth camera to reduce the phase noise. Our current system can achieve ~0.1 mrad temporal phase sensitivity, which is one order of magnitude better over most current QPM systems. Our system can be potentially used for observing morphological changes of cells and probing subnanometer membrane dynamics with millisecond temporal resolution.

Citation Download Citation

Yujie Nie, Yijin Wang, and Renjie Zhou "Development of high sensitivity quantitative phase microscopy for label-free imaging of nanoscale dynamics", Proc. SPIE 11249, Quantitative Phase Imaging VI, 112491W (14 February 2020); https://doi.org/10.1117/12.2547062

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