Ellipsometric Study Of The Optical Anisotropy Of The Plumbum Arachidate Langmuir Films

A . Y. Tronin; A. F. Konstantinova

doi:10.1117/12.961367

8 January 1990 Ellipsometric Study Of The Optical Anisotropy Of The Plumbum Arachidate Langmuir Films

A . Y. Tronin, A. F. Konstantinova

Proceedings Volume 1125, Thin Films in Optics; (1990) https://doi.org/10.1117/12.961367
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

The reflection matrix of plumbum arachidate Langmuir films on silicon was measured by means of the generalized ellipsometric technique. The lateral anisotropy of the films was shown. The problem of light reflection from uniaxial film on isotropic substrate with arbitrary axis orientation was solved and used for the measurment interpretation. A simple generalized ellipsometric technique for measuring the nondiagonal reflection matrix of weak anisotropic medium is described. Film refraction indices, monolayer thickness and the angle between the optical axis of the film and the normal to the surface were determined. Models of molecular packing with lateral anisotropy are discussed. Difference in wetting angle of odd and even monolayers is supposed to be the origin of the noncentrosymmetric structure of bilayer resulting in lateral anisotropy of the film.

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A . Y. Tronin and A. F. Konstantinova "Ellipsometric Study Of The Optical Anisotropy Of The Plumbum Arachidate Langmuir Films", Proc. SPIE 1125, Thin Films in Optics, (8 January 1990); https://doi.org/10.1117/12.961367

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KEYWORDS

Anisotropy

Reflection

Molecules

Silicon films

Silicon

Thin films

Polarization

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