Translator Disclaimer
Presentation
11 March 2020 Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)
Author Affiliations +
Abstract
Light absorption at the facet of a high power diode laser can lead to severe heating and catastrophic optical damage. In this work, a combination of high resolution thermoreflectance imaging and a detailed heat transport model of the diode chip are used to measure facet absorption in diode lasers. This approach permits a direct measurement of the effectiveness of passivation layers in improving facet robustness and device lifetime. The ability to quantify facet absorption is an essential step toward enabling rapid development of alternative passivation technologies and improving the reliability and maximum output power of diode laser systems.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aman Kumar Jha, Chen Li, Kevin P. Pipe, Mark T. Crowley, Daniel Fullager, Jason D. Helmrich, Prabhu Thiagarajan, Robert J. Deri, Rebecca B. Swertfeger, and Paul O. Leisher "Thermoreflectance-based measurements of facet optical absorption in aged high-power diode lasers (Conference Presentation)", Proc. SPIE 11261, Components and Packaging for Laser Systems VI, 112610I (11 March 2020); https://doi.org/10.1117/12.2547344
PROCEEDINGS
PRESENTATION


SHARE
Advertisement
Advertisement
Back to Top