Measurement of laser damage threshold of CdSiP2 at 1064 nm and 1550 nm

Amelia Carpenter; Kevin T. Zawilski; Peter G. Schunemann; San-Hui Chi; Shekhar Guha

doi:10.1117/12.2543795

2 March 2020 Measurement of laser damage threshold of CdSiP₂ at 1064 nm and 1550 nm

Amelia Carpenter, Kevin T. Zawilski, Peter G. Schunemann, San-Hui Chi, Shekhar Guha

Proceedings Volume 11264, Nonlinear Frequency Generation and Conversion: Materials and Devices XIX; 112640X (2020) https://doi.org/10.1117/12.2543795
Event: SPIE LASE, 2020, San Francisco, California, United States

Abstract

Laser damage thresholds of CdSiP₂ have previously been measured at wavelengths of 1064 nm and 2090 nm using nanosecond durations lasers^1,2 and at 1940 nm using a continuous wave laser³. In the continuous wave measurement attempted in the past³, the CdSiP₂ sample was found to withstand an irradiance of 150 kW/cm² for over 60 seconds without any damage to the sample, whereas earlier grown samples of CdSiP₂ exposed to the same irradiance level damaged in 5 seconds or less. In that work, or in any other work to our knowledge, the samples were not exposed to millisecond or longer duration lasers at 1064 nm or 1550 nm. Because of the importance of CdSiP₂ in nonlinear frequency conversion of lasers in the 1000 to 2000 nm spectral range, this study was performed to measure the damage thresholds at wavelengths in this spectral regime. Results of the damage threshold at different laser spot sizes will be presented.

Conference Presentation

Citation Download Citation

Amelia Carpenter, Kevin T. Zawilski, Peter G. Schunemann, San-Hui Chi, and Shekhar Guha "Measurement of laser damage threshold of CdSiP₂ at 1064 nm and 1550 nm", Proc. SPIE 11264, Nonlinear Frequency Generation and Conversion: Materials and Devices XIX, 112640X (2 March 2020); https://doi.org/10.1117/12.2543795

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